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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Al
Formula:
Al
0
.
6
Ga
0
.
4
As
XPS Formula:
Al
0
.
6
Ga
0
.
4
As
Name:
aluminum gallium arsenide (Al0.6Ga0.4As)
CAS Registry No:
106804-30-2
Class:
arsenide, III-V semiconductor
Author Name(s):
Hofmann A., Streubel P., Meisel A.
Journal:
Vacuum 41, 1728
DOI:
10.1016/0042-207X(90)94068-2
Pub Year:
1990
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
73.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
other anode
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The samples were grown by liquid phase epitaxy on Te-doped GaAs (100).
Specimen:
semiconductor
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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