NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

La/Si

CS-2p

0.35

La/Si

CS-2p

0.40

La/Si

CS-2p

0.50

La/Si

CS-2p

0.60

La/Si

CS-2p

0.70

La/Si

CS-2p

0.70

La/Si

CS-2p

1.00

Chemical Shift

CS-2p

0.50

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.3 ML La/Si(111). Clean Si(111) surfaces were prepared by cleaving of n-type (resistivity is 36 Ohm cm) single crystal silicon. The amount of deposited La was measured with a quartz microbalance.