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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Al
Formula:
AlOx/Al
Name:
aluminum oxides/aluminum
CAS Registry No:
7429-90-5
Class:
anhydride, catalyst, element, non-stoichiometric oxide, oxide
Author Name(s):
Summers W.R., McAfee C.D., Schweikert E.A.
Journal:
Nucl. Instruments Methods in Phys. Res. Sec. B 34, 89
DOI:
10.1016/0168-583X(88)90369-2
Pub Year:
1988
book
All Records in this Publication
Data Type:
Chemical Shift
Line Designation:
CS-2p
Chemical Shift (eV):
2.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Native oxide with thickness of 47+-11 A as determined by sputter rate of Al2O3.
Specimen:
native oxide, passive oxide, thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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