NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

Si/Y

silicon/yttrium

CAS Registry No:

7440-21-3

element, IV semiconductor, rare earth

Author Name(s):

Pellissier A., Baptist R., Chauvet G.

Surf. Sci. 210, 99

Pub Year:

1989

book All Records in this Publication

Photoelectron Line

Line Designation:

2s

Binding Energy (eV):

150.60

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.2ML and 3.0 ML Y/Si(111)-(7x7). Principal peak whose binding energy is constant with yttrium coverage. But from coverage between 2.3 and 3.0 ML the Si2p presents a shoulder located at 1.4 eV lower binding energy. Si(111)-c(7x7) was n-type P-doped with

reacted, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), surface coverage from 3ML to 4ML (3ML <= coverage < 4ML), thin layer, vapor deposited

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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