NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ag

Ag/SnO₂

silver/tin dioxide

CAS Registry No:

7440-22-4

IV semiconductor

Author Name(s):

Matsushima S., Teraoka Y., Miura N., Yamazoe N.

Jpn. J. Appl. Phys. Part 1 27, 1798

Pub Year:

1988

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Total Records: 2

Photoelectron Line

Line Designation:

3d_5/2

Binding Energy (eV):

367.60

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Ag(1.5 % wt)/SnO2.

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