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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hg
Formula:
Hg
0
.
85
Zn
0
.
15
Te
Name:
mercury zinc telluride (Hg0.85Zn0.15Te)
CAS Registry No:
107405-14-1
Class:
chalcogenide, II-VI semiconductor, telluride
Author Name(s):
Marbeuf A., Ballutaud D., Triboulet R., Dexpert H., Lagarde P., and Marfaing Y.
Journal:
J. Phys. Chem. Solids 50, 975
DOI:
10.1016/0022-3697(89)90050-4
Pub Year:
1989
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
5d
5/2
Binding Energy (eV):
7.90
Energy Uncertainty:
0.02
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Specimen:
cleaved crystal, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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