NIST X-ray Photoelectron Spectroscopy Database

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SiO₂

silicon dioxide

7631-86-9

anhydride, catalyst, glass, IV semiconductor, IV-VI semiconductor, mineral, oxide

Chao S.S., Takagi Y., Lukovsky G., Pai P., Caster R.C.,Tyler J.T., et al.

Appl. Surf. Sci. 26, 575

Pub Year:

1986

Photoelectron Line

103.40

0.2

data

2.3

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Ar=241.8

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Thermaly grown SiO2.