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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
In
2
S
3
Name:
indium(III) sulfide
CAS Registry No:
12030-24-9
Class:
chalcogenide, III-V semiconductor, sulfide
Author Name(s):
Battistoni C., Gastaldi L., Lapiccirella A., Mattogno G., Viticoli C.
Journal:
J. Phys. Chem. Solids 47, 899
DOI:
10.1016/0022-3697(86)90062-4
Pub Year:
1986
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
162.40
Energy Uncertainty:
0.2
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
crystal
Method of Determining Specimen Composition:
Electron-Probe Microanalysis
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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