Overall Energy Resolution (eV):
Calibration:
Other, Al2p =72.87
Charge Reference:
Element
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
23 A Al2O3/Al. Ar ion etching of Al2O3/Al and oxidation at 523 K in oxygen. The thickness of the layer was determined by NRA. These data are a part of a round robin test. The 15th series. The substrate was prepared by cold rolling of a cast, annealing in
oxidizing atmosphere, oxygen pressure, thermal oxide, thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293