NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-2p

Surface Core-Level Shift (eV) for the first Layer of Atoms:

-0.57

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

35-135

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

21 A Ti/MoSi2(001)-(1x1). Excitation energy was 35 - 135 eV. The energy is referenced to the bulk state of the Si2p line. The deposition rate was measured with quartz crystal oscillator.

Specimen:

chemical vapor deposition, crystal, Low Energy Electron Diffraction, reacted film, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

293