NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

CrN₀.₄₂

CS-2p_3/2

0.05

CuN₀.₀₅

CS-2p_3/2

0.00

FeN₀.₂₂

CS-2p_3/2

0.20

TiN₀.₇₉

CS-2p_3/2

0.95

VN₀.₆₆

CS-2p_3/2

0.90

NiN₀.₂₁

CS-2p_3/2

0.20

TaN₀.₂₈

4f_7/2

22.85

4f_7/2

21.70

WN₀.₂₃

4f_7/2

31.40

4f_7/2

31.10

ZrN₀.₆₈

3d_5/2

179.90

3d_5/2

179.00

HfN₀.₃₉

4f_7/2

14.65

4f_7/2

14.40

MoN

3d_5/2

228.10

3d_5/2

228.00

NbN₀.₅₁

3d_5/2

203.70

3d_5/2

202.50

Photoelectron Line

4f_7/2

31.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The metal was implanted with 6 keV N2+ ions at the angle of 25 degree from the surface normal. The current density was 8 mkA/cm-2. Fluence was 9.6E16 ions/cm-3