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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
(
-
CH
2
C((CH
3
)C(O)O(CH
2
)
3
Si(OCH
3
)
3
)
-
)n
XPS Formula:
silicon atoms in Si
-
C groups
Name:
poly(3-methacryloxypropyltrimethoxysilane)
CAS Registry No:
Class:
organometallic, oxygen, polymer, silane, surface polymer
Author Name(s):
Laoharojanaphand P., Lin T.J., Stoffer J.O.
Journal:
J. Appl. Polymer Sci. 40, 369
DOI:
10.1002/app.1990.070400306
Pub Year:
1990
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
101.10
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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