NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Bi

Bi₁₅.₆Ge₂₀.₁Se₆₄.₃

Bi*₁₅.₆Ge₂₀.₁Se₆₄.₃

bismuth germanium selenium alloy (15.6-20.1-64.3)

CAS Registry No:

alloy, chalcogenide, glass, IV-VI semiconductor

Author Name(s):

Mytilineou E., Kounavis P., Chao B.S.

J. Phys. Cond. Matter 1, 4687

Pub Year:

1989

book All Records in this Publication

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV):

158.20

Energy Uncertainty:

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Thin films of amorphous chalcogenite alloys were prepared by sputtering in Ar atmosphere. X-ray energy-dispersive spectrometry was utilized to determine the film compositions.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙