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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Zn
Formula:
ZnTe
Name:
zinc telluride
CAS Registry No:
1315-11-3
Class:
chalcogenide, II-VI semiconductor, IV-VI semiconductor, telluride
Author Name(s):
Yu E.T., Croke E.T., Chow D.H., Collins D.A., Phillips M.C., McGill T.G., et al
Journal:
J. Vac. Sci. Technol. B 8, 908
DOI:
10.1116/1.584941
Pub Year:
1990
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
Binding Energy (eV):
9.42
Energy Uncertainty:
0.06
Background Subtraction Method:
Shirley
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Specimen:
molecular beam epitaxy
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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