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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Al
Formula:
Al
2
O
3
/Al
XPS Formula:
Al
2
O
3
/Al*
Name:
aluminum(III) trioxide/aluminum
CAS Registry No:
1344-28-1
Class:
anhydride, element, oxide
Author Name(s):
Rajopadhye N.R., Dake S.B., Bhoraskar S.V.
Journal:
Thin Solid Films 142, 127
DOI:
10.1016/0040-6090(86)90308-1
Pub Year:
1986
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
117.90
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Al2p=72.87
Charge Reference:
Element
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
heated, oxidizing atmosphere, thermal oxide, thin layer, wafer
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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