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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
P
Formula:
Yb/InP
XPS Formula:
Yb/InP*
Name:
ytterbium/indium phosphide
CAS Registry No:
22398-80-7
Class:
element, IV-VI semiconductor, lanthanide, phosphide, rare earth
Author Name(s):
de Padova P., Jin X.F., Carriere B., Pinchaux R.
Journal:
Surf. Sci. 211, 675
DOI:
10.1016/0039-6028(89)90828-5
Pub Year:
1989
book
All Records in this Publication
Data Type:
Chemical Shift
Line Designation:
CS-2p
3/2
Chemical Shift (eV):
0.50
Energy Uncertainty:
0.1
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
160
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
0.11-3.5 ML Yb/InP.
Specimen:
crystal, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), thin layer, vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
293
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