NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 12

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Hg₀.₇₈Cd₀.₂₂Te

5d_5/2

8.39

Hg₀.₇₈Cd₀.₂₂Te

5d_3/2

10.22

Hg₀.₉₂Mn₀.₀₈Te

5d_5/2

8.19

Hg₀.₉₂Mn₀.₀₈Te

5d_3/2

9.99

HgTe

5d_5/2

8.12

HgTe

5d_3/2

9.97

Hg₀.₇₈Cd₀.₂₂Te

4d_5/2

40.20

Hg₀.₇₈Cd₀.₂₂Te

4d_3/2

41.61

Hg₀.₉₂Mn₀.₀₈Te

4d_5/2

39.59

Hg₀.₉₂Mn₀.₀₈Te

4d_3/2

41.00

HgTe

4d_5/2

39.52

HgTe

4d_3/2

40.92

Photoelectron Line

4d_3/2

40.92

0.07

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

40-160

Overall Energy Resolution (eV):

0.3

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The Fermi level was determined by deposition of 50-100 A Cr films in situ onto the cleaved surface. Overall energy resolution was in range 0.4 - 0.6 eV.