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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
N
Formula:
[Cu(S
2
CN(C
2
H
5
)
2
)
2
]
XPS Formula:
[Cu(S
2
CN*(C
2
H
5
)
2
)
2
]
Name:
copper bis(diethyl dithiocarbamate)
CAS Registry No:
Class:
thiourea
Author Name(s):
Healy P.C., Myhra S., Stewart A.M.
Journal:
Jpn. J. Appl. Phys. Part 2 26, L1884
DOI:
10.1143/JJAP.26.L1884
Pub Year:
1987
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
399.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
Fresh and clean surfaces were prepared by grinding the powdered specimens. Copper is in bivalent state.
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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