NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Si

Yb/Si

ytterbium/silicon

CAS Registry No:

7440-21-3

element, lanthanide, rare earth

Author Name(s):

Hofmann R., Henle W.A., Netzer F.P., Neuber M.

Phys. Rev. B 46, 3857

Pub Year:

1992

book All Records in this Publication

Chemical Shift

Line Designation:

CS-2p

Chemical Shift (eV):

-1.80

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

other source

X-ray Energy:

140

Overall Energy Resolution (eV):

0.3

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

8 ML Yb/p-type Si(111)-(7x7) with a resistivity of 1 - 2.5 ohm cm. The wafer was prepared by flashing the sample to 1223 - 1273 K. The thickness was measured using a quartz-crystal thickness monitor.

reacted, semiconductor, thin layer, vapor deposited, wafer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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