NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Formula:

O₂/Mg/Ru

XPS Formula:

MgOx

Name:

oxygen/magnesium/ruthenium

CAS Registry No:

Class:

non-stoichiometric oxide, oxide

Author Name(s):

Malik I.J., Hrbek J., Shek M.-L., Bzowski A., Kristof P., and Sham T.K.

Journal:

J. Vac. Sci. Technol. A 10, 2367

DOI:

Pub Year:

1992

book All Records in this Publication

Auger-Electron Line

L₂₃VV

31.00

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.4

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

10 L O2/3 ML Mg/Ru(001). The substrate was cleaned by Ar+ ion bombardment and cycles of oxygen adsorption-desorption.

Specimen:

multilayer structure, oxidizing atmosphere, oxygen pressure, surface coverage from 3ML to 4ML (3ML <= coverage < 4ML), vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300