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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hf
Formula:
C
10
H
10
I
2
Hf
Name:
hafnocene diiodide
CAS Registry No:
Class:
cyclopentadienyl, iodide, organometallic, other ring
Author Name(s):
Gassman P.G., Winter C.H.
Journal:
Organometallics 10, 1592
DOI:
10.1021/om00051a059
Pub Year:
1991
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
17.10
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was prepared on polyethylene-coated aluminum chip, and the binding energy was calibrated against the C1s signal of polyethylene.
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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