NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 22

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Si₁.₃₆Al₃.₂₉Mg₂.₃Ca₀.₉₉O₁₀(OH)₂

2p_3/2

74.30

Si₁.₃₆Al₃.₂₉Mg₂.₃Ca₀.₉₉O₁₀(OH)₂

531.50

Si₁.₃₆Al₃.₂₉Mg₂.₃Ca₀.₉₉O₁₀(OH)₂

2p_3/2

102.30

Si₄.₀Mg₂.₆₅Li₀.₃₅K₀.₀₈Na₀.₂₇O₁₀(OH)₂

2p_3/2

103.20

Si₄.₀Mg₂.₆₅Li₀.₃₅K₀.₀₈Na₀.₂₇O₁₀(OH)₂

532.30

Si₂.₁₁Al₃.₈₈Fe₀.₀₁Mg₀.₀₃K₀.₀₁Na₀.₁₉Ca₀.₈₁O₁₀(OH)₂

2p_3/2

102.20

Si₂.₁₁Al₃.₈₈Fe₀.₀₁Mg₀.₀₃K₀.₀₁Na₀.₁₉Ca₀.₈₁O₁₀(OH)₂

531.40

Si₂.₁₁Al₃.₈₈Fe₀.₀₁Mg₀.₀₃K₀.₀₁Na₀.₁₉Ca₀.₈₁O₁₀(OH)₂

2p_3/2

74.30

Si₂.₈₄Al₁.₂₅Ti₀.₀₆Mg₂.₈₂Fe₀.₀₂K.₈₇Na₀.₀₆Ca₀.₀₃O₁₀(OH)₂

2p_3/2

74.10

Si₂.₈₄Al₁.₂₅Ti₀.₀₆Mg₂.₈₂Fe₀.₀₂K.₈₇Na₀.₀₆Ca₀.₀₃O₁₀(OH)₂

531.80

Si₂.₈₄Al₁.₂₅Ti₀.₀₆Mg₂.₈₂Fe₀.₀₂K.₈₇Na₀.₀₆Ca₀.₀₃O₁₀(OH)₂

2p_3/2

102.70

Si₄.₀Mg₂.₉₈Fe₀.₀₂O₁₀(OH)₂

2p_3/2

103.50

Si₄.₀Mg₂.₉₈Fe₀.₀₂O₁₀(OH)₂

532.60

Si₂.₈₉Al₁.₁₉Ti₀.₀₂Mg₂.₈₂Fe₀.₀₆K₀.₀₃Ca₀.₄₆O₁₀(OH)₂

2p_3/2

74.40

Si₂.₈₉Al₁.₁₉Ti₀.₀₂Mg₂.₈₂Fe₀.₀₆K₀.₀₃Ca₀.₄₆O₁₀(OH)₂

531.80

Si₂.₈₉Al₁.₁₉Ti₀.₀₂Mg₂.₈₂Fe₀.₀₆K₀.₀₃Ca₀.₄₆O₁₀(OH)₂

2p_3/2

102.80

Si₃.₁₆Al₂.₇₉Fe₀.₀₃Mg₀.₀₄K₀.₇₉Na₀.₀₄Ca₀.₀₁O₁₀(OH)₂

2p_3/2

102.80

Si₃.₁₆Al₂.₇₉Fe₀.₀₃Mg₀.₀₄K₀.₇₉Na₀.₀₄Ca₀.₀₁O₁₀(OH)₂

531.90

Si₃.₁₆Al₂.₇₉Fe₀.₀₃Mg₀.₀₄K₀.₇₉Na₀.₀₄Ca₀.₀₁O₁₀(OH)₂

2p_3/2

74.70

Si₄Al₁.₉₂Fe₀.₀₄Mg₀.₀₇O₁₀(OH)₂

2p_3/2

75.80

Si₄Al₁.₉₂Fe₀.₀₄Mg₀.₀₇O₁₀(OH)₂

532.90

Si₄Al₁.₉₂Fe₀.₀₄Mg₀.₀₇O₁₀(OH)₂

2p_3/2

103.70

Photoelectron Line

2p_3/2

102.80

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

Mg, Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment: