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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
O
Formula:
Si
4
.
0
Mg
2
.
98
Fe
0
.
02
O
10
(OH)
2
XPS Formula:
Si
4
.
0
Mg
2
.
98
Fe
0
.
02
O*
10
(OH)
2
Name:
talc
CAS Registry No:
14807-96-6
Class:
mineral, silicate
Author Name(s):
Gonzalez-Elipe A.R., Espinos J.P., Munuera G., Sanz J., Serratosa J.M.
Journal:
J. Phys. Chem. 92, 3471
DOI:
10.1021/j100323a031
Pub Year:
1988
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
532.60
Energy Uncertainty:
0.1
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg, Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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