NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 36

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

CdTe

DS-4d

0.66

CdTe

DS-4d

1.46

CdTe

DS-4d

0.66

CdTe

DS-4d

1.48

CdTe

DS-4d

1.47

CdTe

DS-4d

0.67

Sb/CdTe

DS-4d

0.65

Sb/CdTe

DS-4d

1.47

Sb/CdTe

DS-4d

1.26

Sb/CdTe

DS-4d

0.65

Sb/CdTe

DS-4d

1.48

Sb/CdTe

DS-4d

1.24

Sb/CdTe

INT-4d_5/2

0.55

Sb/CdTe

4d_5/2

11.15

Sb/CdTe

4d_5/2

32.16

Sb/CdTe

4d_5/2

11.03

Sb/CdTe

4d_5/2

40.31

Sb/CdTe

4d_5/2

40.42

Sb/CdTe

4d_5/2

32.88

CdTe

4d_5/2

11.18

CdTe

4d_5/2

39.82

CdTe

4d_5/2

40.45

CdTe

4d_5/2

10.54

CdTe

4d_5/2

11.15

CdTe

4d_5/2

40.43

CdTe

SS-4d_5/2

1.00

CdTe

SS1-4d_5/2

0.60

CdTe

SS1-4d_5/2

0.58

CdTe

SS1-4d_5/2

0.57

Sb/CdTe

SS1-4d_5/2

0.59

Photoelectron Line

4d_5/2

40.43

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.3

Calibration:

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-type CdTe(100)-(2x1), In-doped with resistivity of 2E8 Ohm cm. Several cycles of sputtering with 500 eV Ar+ ions and then annealing at 598 K were performed in order to generate a good 2x1 surface. Branching ratio is 0.75.