NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 36

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

CdTe

DS-4d

0.66

CdTe

DS-4d

0.66

Sb/CdTe

DS-4d

0.65

Sb/CdTe

DS-4d

0.65

CdTe

DS-4d

0.67

Sb/CdTe

DS-4d

1.26

Sb/CdTe

DS-4d

1.24

CdTe

DS-4d

1.46

CdTe

DS-4d

1.48

CdTe

DS-4d

1.47

Sb/CdTe

DS-4d

1.47

Sb/CdTe

DS-4d

1.48

Sb/CdTe

INT-4d_5/2

0.55

Sb/CdTe

4d_5/2

32.88

CdTe

4d_5/2

40.43

CdTe

4d_5/2

39.82

CdTe

4d_5/2

40.45

Sb/CdTe

4d_5/2

40.42

Sb/CdTe

4d_5/2

40.31

CdTe

4d_5/2

11.18

Sb/CdTe

4d_5/2

32.16

Sb/CdTe

4d_5/2

11.03

Sb/CdTe

4d_5/2

11.15

CdTe

4d_5/2

11.15

CdTe

4d_5/2

10.54

CdTe

SS-4d_5/2

1.00

CdTe

SS1-4d_5/2

0.58

Sb/CdTe

SS1-4d_5/2

0.60

Sb/CdTe

SS1-4d_5/2

0.59

CdTe

SS1-4d_5/2

0.57

Photoelectron Line

4d_5/2

32.88

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.40

Lorentzian Width (eV):

0.23

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.3

Calibration:

Charge Reference:

Gold

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

10 L Sb/n-type CdTe(100)-(2x2),in-doped with resistivity of 2E8 Ohm cm. MBE generated surf. were obtained by growing As on clean sputter/anneal 2x1 surf. with substrate at 573 K and annealed at 548 K. Branching ratio is 0.65.

Specimen:

annealed, crystal, heated, molecular beam epitaxy, semiconductor, thin layer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

High-energy Electron Diffraction

Specimen Temperature (K):

300