There was a problem with the connection!
menu
NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
One Page Summary
Instruction:
Click on selected Tab for more information.
General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
W
Formula:
W
2
S
2
(S
2
)(S
2
CN(C
2
H
5
)
2
)
2
XPS Formula:
W*
2
O
2
(nu
-
S
2
)(S
2
CN(C
2
H
5
)
2
)
2
Name:
di-mu-thio-bis(thiotungsten) bis(diethyldithiocarbamate)
CAS Registry No:
Class:
sulfur, sulfur ligand, thiourea
Author Name(s):
Ansari M.A., Chandrasekaran J., Sarkar S.
Journal:
Bull. Chem. Soc. Jpn. 61, 2265
DOI:
10.1246/bcsj.61.2265
Pub Year:
1988
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4d
5/2
Binding Energy (eV):
245.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
Go Back
Home
search
Identify Unknown Spectral Lines
search
Retrieve Data for Elements
keyboard_arrow_down
Selected Spectral Type and Element
Reference Data
search
Retrieve Data for Compounds
keyboard_arrow_down
Elemental Composition
Chemical Name
Chemical Classes
Data for One Element
assessment
Plots
keyboard_arrow_down
Wagner Plot
Chemical Shifts
search
Search Scientific Citations
assignment
More Options
keyboard_arrow_down
Introduction
Data Field Definitions
Citation
Contact
Version History
Acknowledgement
Disclaimer
An error has occurred. This application may no longer respond until reloaded.
Reload
🗙