NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

(^-NHC(O)NHC₆H₄CH₂C₆H₄NHC(O)NHC₆F₄C₆F₄^-)n

poly(aminocarbonylamino-1,4-phenylenemethylene-1,4-phenyleneaminocarbonylamino(2,2',3,3',5,5'6,6'-octafluorobiphenyl)-4,4'-diyl)

CAS Registry No:

Class:

amide, halogenated compound, multiple rings, nitrogen, oxygen, phenyl benzene, polymer, sulfur, urea

Author Name(s):

Yoon S.C., Ratner B.D.

Journal:

Macromolecules 19, 1068

DOI:

Pub Year:

1986

book All Records in this Publication

Photoelectron Line

1s, sat

406.70

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun (Ep=10-15 eV) was used for charge compensation. The films were 200 - 800 A in thickness.

Specimen:

cast film, insulator, thick film, thin film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300