NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 5

Data Type:

Separation from the Strongest Auger Line

Line Designation:

SA-L₂VV

Separation Energy (eV):

1.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

other anode

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

4 and 6 A Tb/n-type Si(111)-(7x7) with a resistivity of 1.8 - 3.2 ohm cm. The thickness was measured using a quartz-crystal thickness monitor. The substrate surface was cleaned by cycles of Ar+ ion bombardment and annealing (T = 1100 K) by electron bombar