NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

O₂/InP

CS-3d

0.25

O₂/InP

CS-4d

0.00

O₂/InP

CS-4d

0.25

O₂/InP

CS-4d

0.25

O₂/InP

CS-3d

0.25

O₂/InP

CS-2p

4.40

O₂/InP

CS-2p

0.00

O₂/InP

CS-2p

4.40

Chemical Shift

CS-2p

4.40

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1E8 - 1E13 L O2/n-type InP(111)-(1x1) ) with a carrier concentration of 6E17 cm-3. The substrate was cleaned by Ar+ ion bombardment and subsequently annealed (T = 623 K). The chemical shift is relative to the pure InP.

Specimen:

oxidizing atmosphere, oxygen pressure

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300