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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Si/AlAs
Name:
silicon/aluminum arsenide
CAS Registry No:
7440-21-3
Class:
element, III-V semiconductor
Author Name(s):
Bratina G., Sorba L., Antonini A., Vanzetti L., Franciosi A.
Journal:
J. Vac. Sci. Technol. B 9, 2225
DOI:
10.1116/1.585725
Pub Year:
1991
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
98.89
Energy Uncertainty:
0.05
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
0.69
Calibration:
Charge Reference:
Valence band minimum
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
A 150 A silicon film was grown on AlAs(001) at 773 K . Emission angle = 55 degrees.
Specimen:
crystal, molecular beam epitaxy, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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