NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 5

Data Type:

Doublet Separation for Photoelectron Lines

Line Designation:

DS-4d

Double Separation (eV):

2.65

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

120

Overall Energy Resolution (eV):

0.5

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

0.1 and 5 ML Ba/n-type As-doped Si(100)-(2x1). The substrate was cleaned by etching in a 1% HF in water solution, followed by mild Ar+ ion bombardment and annealing by direct current flow through the sample.

Specimen:

multilayer, reacted, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), thin layer, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300