NIST X-ray Photoelectron Spectroscopy Database

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Ni₀.₉₈S₀.₅Se₀.₅

nickel sulfide selenide

chalcogenide, IV-VI semiconductor, selenide, sulfide

Matoba M., Anzai S., Fujimori A.

J. Phys. Soc. Japan 60, 4230

Pub Year:

1991

Photoelectron Line

229.20

0.05

other

mixed Gaussian/Lorentzian

1.05

0.54

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was cleaned by Ar+ ion bombardment (Ep = 0.5 keV, time = 1 min, normal incidence). Asymmetry parameter = 0.01.