NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Formula:

(^-Si(CH₃)₂O^-)n

Name:

poly(dimethyl siloxane)

CAS Registry No:

9016-00-6

Class:

organometallic, oxygen, polymer

Author Name(s):

Pertsin A.J., Gorelova M.M., Levin V.Y., Makarova L.I.

Journal:

J. Appl. Polymer Sci. 45, 1195

DOI:

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

284.80

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was Si0.25C0.50O0.25. FRR mode. No x-ray induced damage to the sample was detected during analysis.

Specimen:

insulator, thick film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300