NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Formula:

(^-CH₂(CH₂)₂CH₂O^-)n

XPS Formula:

(^-CH₂(C*H₂)₂CH₂O^-)n

Name:

poly(tetrahydrofuran)

CAS Registry No:

25190-06-1

Class:

ether, oxygen, polymer

Author Name(s):

Briggs D., Beamson G.

Journal:

Anal. Chem. 64, 1729

DOI:

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

284.80

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun (Ep = ~1 eV, Ip = 2.3 A) was used for charge compensation.

Specimen:

cast film, thick film

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300