NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ag

Ag/CH₃(CH₂)₁₇SH/Au

silver/octadecanethiol/gold

CAS Registry No:

sulfur, thiol

Author Name(s):

Tarlov M.J.

Langmuir 8, 80

Pub Year:

1992

book All Records in this Publication

Chemical Shift

Line Designation:

CS-3d_5/2

Chemical Shift (eV):

0.30

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

17 A Ag/27+-2 A CH3(CH2)17CH2/2000 A polycrystalline Au. Self-assembled monolayer. FAT mode. The film thicknesses were determined by ellipsometry and stylus measurements. The amount of deposited Ag was measured using a quartz-crystal thickness monitor.

multilayer structure, surface coverage from 1ML to 2ML (1ML <= coverage < 2ML), vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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