NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Pt/Si

CS-2p

1.05

Pt/Si

CS-2p

1.00

Pt/Si

CS-4f_7/2

1.70

Pt/Si

CS-4f_7/2

0.00

Pt/Si

4f_7/2

71.22

Pt/Si

4f_7/2

72.82

Ir/Si

4f_7/2

60.82

Si/Ir

4f_7/2

61.12

4f_7/2

60.82

Pt/Si

99.72

Si/Pt

98.97

Pt/Si

100.22

Si/Pt

98.97

99.22

Si/Ir

99.02

Si/Ir

99.52

Si/Ir

99.62

Si/Ir

99.07

Photoelectron Line

98.97

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.7

Calibration:

Pt4f7 = 71.12

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

5 A Pt/p-type Si(100)-(2x1) with a resistivity of 3 ohm cm. The substrate was cleaned by annealing (T =1023 K, time = 20 min). Peak locations: Voigt function. The thickness was measured using a quartz-crystal thickness monitor.