NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 15

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiC

281.26

Pd/SiC

282.52

Au/SiC

282.98

Ag/SiC

283.02

Mn/SiC

283.31

Al/SiC

283.28

Au/SiC

283.72

Al/SiC

283.82

Mg/SiC

283.82

Mg/SiC

283.79

Pd/SiC

283.01

Au/SiC

282.77

Ag/SiC

283.20

Al/SiC

283.92

Mg/SiC

283.85

Photoelectron Line

283.82

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

~20-35 A Al/6H polytype of hexagonal n-type alpha-SiC(0001)-(1x1). The sample was heated to 873 K for a short time. The Schottky barrier height was 0.30 eV.

Specimen:

chemical vapor deposition, reacted, vapor deposited and heated

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300