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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
NiSiO
3
Name:
nickel(II) silicate
CAS Registry No:
Class:
double oxide, oxide, silicate
Author Name(s):
Gonzalez-Elipe A.R., Alvarez R., Holgado J.P., Espinos J.P., Munuera G., and Sanz J.M.
Journal:
Appl. Surf. Sci. 51, 19
DOI:
10.1016/0169-4332(91)90058-R
Pub Year:
1991
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
103.00
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was heated in vacuum at increasing temperature up to 873 K for 1h.
Specimen:
annealed, crystal, pelletized
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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