NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ba

Ba/Si

barium silicide approx. BaSi₂

barium/silicon

CAS Registry No:

7440-39-3

alkaline earth, element, silicide

Author Name(s):

Weijs P.J.W., Fuggle J.C., van der Heide P.A.M.

Surf. Sci. 260, 97

Pub Year:

1992

book All Records in this Publication

Photoelectron Line

Line Designation:

4d

Binding Energy (eV):

90.25

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

5 ML Ba/n-type As-doped Si(100)-(2x1) was annealed at ~ 550 K for 50 min. The substrate was cleaned by etching in a 1% HF in water solution, followed by mild Ar+ ion bombardment and annealing by direct current flow through

annealed, multilayer, reacted, thin layer, vapor deposited

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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