NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

Ag/Ge

silver/germanium

7440-56-4

element

Le Lay G., Johnson R.L., Seemann R., Grey F., Feidenhans'l R., and Nielsen M.

Journal:

Surf. Sci. 287, 539

DOI:

Pub Year:

1993

book All Records in this Publication

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift:

-0.26

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.38

Lorentzian Width (eV):

0.15

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.35

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Ge(111)-(R3xR3)R30-Ag. Undoped Ge(111) was cleaned by Ar+ ion bombardment and annealed. Branching ratio = 0.67. .

Specimen:

crystal, reacted, semiconductor, sputtered and heated, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

XPS–scanning Tunneling Microscopy, Low-energy Electron Diffraction

Specimen Temperature (K):

300