NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 7

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.57

Sn/Ge

DS-3d

0.57

Sn/Ge

SS-3d_5/2

-0.26

Sn/Ge

SS-3d_5/2

-0.64

SS-3d_5/2

-0.23

SS-3d_5/2

-0.73

SS-3d_5/2

0.17

Data Type:

Surface Core-level Shift

Line Designation:

SS-3d_5/2

Surface Core-Level Shift (eV):

-0.26

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.75

Lorentzian Width (eV):

0.30

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

70, 90,110

Overall Energy Resolution (eV):

0.09

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Ga-doped Ge(111)-(7x7)-Sn with a resistivity of 0.004 - 0.1 ohm cm. The (7x7) reconstruction was prepared by deposition of 0.4 ML of Sn, and subsequent annealing (T = 773 K) for a few minutes.