NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Type:

Photoelectron Line

Line Designation:

Binding Energy (eV):

399.50

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Si2p = 99.34

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

2.0 +- 0.5 L HN3/B-doped Si(111)-(7x7) with a resistivity of 10 ohm cm. The substrate was annealed at temperature more than 1500 K. The curve fitting was based on equal FWHMs and intensities of the nitrogen states (H-N*=N=&N and H-N=N=&N*).