NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

Formula:

Na₂S₂O₃

XPS Formula:

sulfide^-type sulfur atoms

Name:

sodium thiosulfate

CAS Registry No:

7772-98-7

Class:

alkali, chalcogenide, sulfate, sulfite

Author Name(s):

Peisert H., Chasse T., Streubel P., Meisel A., Szargan R.

Journal:

J. Electron Spectrosc. Relat. Phenom. 68, 321

DOI:

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

162.50

0.2

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The Au M4N7N7 energy of 2101.2 eV was also used for calibration. FAT mode.

Specimen:

crystal, solid on double-sided tape

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300