NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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S

Cr/MoS₂

sulfur atoms attached to S

chromium/molybdenum disulfide

CAS Registry No:

1317-33-5

alloy, catalyst, chalcogenide, element, II-VI semiconductor, sulfide

Author Name(s):

Durbin T.D., Lince J.R., Didziulis S.V., Shuh D.K., Yarmoff J.A.

Surf. Sci. 302, 314

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

Line Designation:

2p_3/2

Binding Energy (eV):

163.50

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

230

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

5 and 7 A Cr/MoS2(0001), natural molybdenite crystal cleaned by annealing (T = 973 K, time = 10 min). Branching ratio = 0.50. The Cr film thickness was determined by XPS.

annealed, cleaved crystal, crystal, reacted, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300

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