NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 3

Data Type:

Surface Core-level Shift for the Third Layer of Atoms

Line Designation:

SS3-1s

Surface Core-Level Shift (eV) for the third Layer of Atoms:

-0.27

Energy Uncertainty:

0.025

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.215

Lorentzian Width (eV):

0.090

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

123 - 160

Overall Energy Resolution (eV):

0.07

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Be(0001). Asymmetry parameter = 0.02. The Gaussian widths were 0.215 eV at 122 eV and 0.235 eV at 170 eV. The overall energy resolutions were 0.070 eV at 123 eV and 0.110 eV at 170 eV. The spectra were recorded at normal emission and at 40 degrees.