NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

rhodium

7440-16-6

element

Prince K.C., Santoni A., Morgante A., Comelli G.

Journal:

Surf. Sci. 317, 397

DOI:

Pub Year:

1994

book All Records in this Publication

Data Type:

Surface Core-level Shift

Line Designation:

SS-3d_5/2

Surface Core-Level Shift (eV):

-0.65

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.4

Lorentzian Width (eV):

0.3

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

395

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Rh(110)-(1x1). The total FWHM was 0.67 eV. Asymmetry parameter = 0.165 +- 0.05. Emission angles were 0 and 70 degrees.

Specimen:

crystal, metal foil

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300