NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 12

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

0.59

Ag/Ge

DS-3d

0.59

Ag/Si

DS-2p

0.61

Ag/Ge

INT-3d_5/2

0.33

Ag/Ge

INT-3d_5/2

-0.26

Ag/Ge

INT-3d_5/2

0.33

Ag/Ge

INT-3d_5/2

-0.33

Ag/Si

INT-2p_3/2

0.27

Ag/Ge

INT-3d_5/2

-0.35

Ag/Ge

SS-3d

-0.74

SS-3d_5/2

-0.27

SS-3d

-0.74

Data Type:

Doublet Separation for Photoelectron Lines

Line Designation:

DS-3d

Double Separation (eV):

0.59

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.34

Lorentzian Width (eV):

0.15

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Undoped Ge(111) was cleaned by Ar+ ion bombardment and annealed until a sharp c(2x8) LEED pattern emerged. Singularity index = 0.1. Branching ratio = 0.67.

Specimen:

crystal, semiconductor, sputtered and heated

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

XPS–scanning Tunneling Microscopy, Low-energy Electron Diffraction

Specimen Temperature (K):

300