NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

TiC

carbon atoms segregated to the surface

titanium carbide

CAS Registry No:

12070-08-5

carbide

Author Name(s):

Johansson L.I., Johansson H.I.P., Hakansson K.L.

Phys. Rev. B 48, 14520

Pub Year:

1993

book All Records in this Publication

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-1s

Surface Core-Level Shift (eV) for the second Layer of Atoms:

0.43

Energy Uncertainty:

0.04

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.23

Lorentzian Width (eV):

0.40

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

330

Overall Energy Resolution (eV):

0.23

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

TiC(100)-(1x1). The surface was cleaned by a 5-min Ar+ ion bombardment and by repeated flash heatings. The Lorentzian FWHM of the bulk component was 0.26 eV. The Gaussian FWHM was 0.27 eV at 380 eV. Asymmetry parameter = 0.04.

crystal, sputtered and heated

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

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