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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hg
Formula:
Hg/Si
Name:
mercury/silicon
CAS Registry No:
7439-97-6
Class:
element
Author Name(s):
Li D., Lin J., Li W., Lee S., Vidali G., and Dowben P.A.
Journal:
Surf. Sci. 280, 71
DOI:
10.1016/0039-6028(93)90357-P
Pub Year:
1993
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
5d
3/2
Binding Energy (eV):
9.65
Energy Uncertainty:
0.05
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
55
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
5 L Hg/Si(111)-(7x7) doped with a carrier concentration of 7E14 cm-3. The spectra were recorded at normal emission.
Specimen:
cooled, vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
110
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