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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Tl
Formula:
TlCr
5
S
8
Name:
thallium pentachromium octasulfide
CAS Registry No:
Class:
chalcogenide, sulfide
Author Name(s):
Bensch W., Worner E., Muhler M., Ruschewitz U.
Journal:
J. Solid State Chem. 110, 234
DOI:
10.1006/jssc.1994.1164
Pub Year:
1994
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
5/2
Binding Energy (eV):
123.20
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
1.8
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au4f7 = 84.00
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
The sample was prepared by reacting the elements at 1273 K for 10 days. After reducing the temperature to 1223 K the sample was fired for 5 days.
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
295
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